Scanning Electron Microscopy and X-ray Microanalysis

Book Description

Providing a comprehensive introduction to the capabilities and use of scanning electron microscopes (SEM) and x-ray spectrometers, this highly acclaimed text emphasizes practical aspects of imaging and analysis for a broad audience of students and practitioners whose backgrounds span a wide range of science and technology. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers, the characteristics of electron beam - specimen interactions, image formation and interpretation, the use of x-rays for qualitative and quantitative analysis and the methodology for structural analysis using electron back-scatter diffraction. SEM sample preparation methods for hard materials, polymers, and biological specimens are covered in separate chapters. In addition, techniques for the elimination of charging in non-conducting specimens are detailed. A database of useful parameters for SEM and X-ray micro-analysis calculations and enhancements to the text chapters are available on an accompanying CD.

This third edition has been extensively revised, including new sections on:

Variable-pressure SEM,
Electron backscatter diffraction (EBSD),
Recent developments in x-ray detectors,

and expanded coverage of:

Low-voltage SEM,
X-ray mapping,
Specimen preparation.

The text has been used in educating over 3,000 students at the Lehigh Microscopy School SEM short course as well as thousands of undergraduate and graduate students at universities worldwide.

Customer Reviews:

The bibel for EM and X-ray Analysis.......2007-03-14

This book is a great book for learning the Basics about Electron Microscopy and X-ray Analysis. You get a good overview!

Scanning Electron Microscopy Book.......2007-01-10

The book came in excellent condition as stated. It also arrived in a timely manner.

Excellent introduction to SEM and EPMA.......2006-12-06

This text does an excellent job of getting the reader acquainted with the interrelated subjects of scanning electron microscopy (SEM) and electron probe microanalysis (EPMA). I think the SEM material was somewhat better presented, especially the chapter on electron optics. The EPMA material was certainly adequate, though I think a bit more detail on matrix corrections could have been transferred from the CD into the text. That said, I generally like the new format used in the third edition of putting the essentials in the text and leaving the rest on CD. It makes the text much more satisfing to read than the second edition, which used annoying lines in the margin to indicate essential material. The figures in the text are quite good and add to the authors' discussion nicely. Sometimes a large number of authors makes a book a little fragmented, but I think that these authors have done a good job of integrating their styles. I recommend starting here if you have an interest in the subject.

PS: Keep in mind that the authors describe generally how SEM and EPMA work. The exact specifications of your SEM/EPMA system may require you to reapply some of the ideas they teach. For example, the model TTL detector they describe may differ from your SEM's proprietary TTL detector in important ways. The point is to be aware of this and use the principles in the text to understand the significance of the differences.

Awsome book for Scanning Electron Microscopy and X-Ray Analysis.......2006-03-11

This book covers almost all aspects of the subject and the CD attached covers the recent development in the field.
This is the book one should have for the subject.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists

Average customer rating:

Excellent book for all types of audience
Excellent text
A very good text book to own
Excellent resource for Electron Microscopists

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Joseph Goldstein , Dale E. Newbury , Patrick Echlin , David C. Joy , Alton D. Romig Jr. , Charles E. Lyman , Charles Fiori , and Eric Lifshin
Manufacturer: Springer
ProductGroup: Book
Binding: Hardcover

Biotechnology | Biological Sciences | Science | Subjects | Books

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Customer Reviews:

Excellent book for all types of audience.......2002-01-01

It was a privilege to learn the subjects of SEM and TEM from the the author of this book himself (David Joy). This is an excellent book which starts from the basics and it depends on the researcher how deep he wanna go. The book provides in depth analysis as well if required. Great resource book.

Excellent text.......2000-10-12

Goldstein et al have written a book that serves as an excellent introduction to the SEM, and is also a formidable reference. When I took SEM at NC State University, it was taught from this book. Between our professor and this text, I learned the ins and outs of the SEM, and I keep the book within arms reach whenever I'm at work.

Goldstein covers everything from the basics of operation, through image formation, sample prep, usage in particular fields of study -- everything!

If you get one SEM book, get this one.

A very good text book to own.......2000-09-22

This is an excellent textbook for graduate students majoring in Materials Science. The text is easy to read, and accompanied by plenty of photographs and schematics, is easy to understand. Covers almost every aspect of SEM and X-ray micro-analysis e.g. underlying science, technology, and practical use. Each chapter begins at a basic level and gradually develops the subject to intricate detail, and depending on the level of study one may skip chapters or part of a chapter.

Excellent resource for Electron Microscopists.......1999-02-20

This book, although not the newest textbook on the market, is THE textbook to have if you are looking for the history, theory or applications of electron microscopy and x-ray microanalysis. Well written, thorough and packed full of well-designed diagrams illustrating the principles described. I've used this textbook in classroom and laboratory settings with excellent results. Looking forward to the next edition!

Advanced Scanning Electron Microscopy and X-Ray Microanalysis

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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Patrick Echlin , C.E. Fiori , Joseph Goldstein , David C. Joy , and Dale E. Newbury
Manufacturer: Plenum Press
ProductGroup: Book
Binding: Hardcover

Electron Microscopes & Microscopy | Experiments, Instruments & Measurement | Science | Subjects | Books

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X-Ray Microanalysis in the Electron Microscope (Practical Methods in Electron Microscopy)

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Manufacturer: Elsevier Science
ProductGroup: Book
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Book Description

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Manufacturer: Springer
ProductGroup: Book
Binding: Spiral-bound

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Book Description

The name "Helots" evokes one of the most famous peculiarities of ancient Sparta, the system of dependent labor that guaranteed the livelihood of the free citizens. The Helots fulfilled all the functions that slaves carried out elsewhere in the Greek world, allowing their masters the leisure to be full-time warriors. Yet, despite their crucial role, Helots remain essentially invisible in our ancient sources and peripheral and enigmatic in modern scholarship. This book is devoted to a much-needed reassessment of Helotry and of its place in the history and sociology of unfree labor. The essays deal with the origins and historical development of Helotry, with its sociological, economic, and demographic aspects, with its ideological construction and negotiation.

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